| Liewald, Clemens (2018): Microscopy and nanoscopy of organic semiconductors for structural and electronic analysis. Dissertation, LMU München: Faculty of Physics |
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Liewald_Clemens.pdf 23MB |
DOI: 10.5282/edoc.22907
| Item Type: | Theses (Dissertation, LMU Munich) |
|---|---|
| Subjects: | 500 Natural sciences and mathematics 500 Natural sciences and mathematics > 530 Physics |
| Faculties: | Faculty of Physics |
| Language: | English |
| Date of oral examination: | 10. July 2018 |
| 1. Referee: | Nickel, Bert |
| MD5 Checksum of the PDF-file: | 8b5b0a8b179c9c9c4a7957da47de3cf9 |
| Signature of the printed copy: | 0001/UMC 25820 |
| ID Code: | 22907 |
| Deposited On: | 04. Oct 2018 12:14 |
| Last Modified: | 23. Oct 2020 16:42 |
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