| Kloft, Stephan (2020): Entwicklung eines Raster-Sonden-Mikroskops (SPM) für die Analyse oberflächenadsorbierter und selbstassemblierter Nanostrukturen. Dissertation, LMU München: Faculty of Geosciences |
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Kloft_Stephan.pdf 11MB |
DOI: 10.5282/edoc.27561
| Item Type: | Theses (Dissertation, LMU Munich) |
|---|---|
| Subjects: | 500 Natural sciences and mathematics 500 Natural sciences and mathematics > 550 Earth sciences |
| Faculties: | Faculty of Geosciences |
| Language: | German |
| Date of oral examination: | 15. December 2020 |
| 1. Referee: | Lackinger, Markus |
| MD5 Checksum of the PDF-file: | 37147aa78ded8e3c28548c3089fbc699 |
| Signature of the printed copy: | 0001/UMC 27802 |
| ID Code: | 27561 |
| Deposited On: | 19. Mar 2021 10:22 |
| Last Modified: | 23. Mar 2021 08:46 |
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